[1] Krishnaswamy S,Viamontes G F,Markov I L,et al.Accurate reliability evaluation and enhancement via probabilistic transfer matrices[A]. Proceedings of Design,Automation and Test in Europe Conference and Exhibition,Munich[C]. New York:ACM Society,2005.282-287.
[2] 王真,江建慧,沈君华,等.基于概率转移矩阵的电路可靠性并行计算方法[J]. 小型微型计算机系统,2008,29(2):357-360. Wang Z,et al.Parallelprocessing of the probabilistic transfer matrix based circuits reliability calculation[J]. Journal of Chinese Computer Systems,2008,29(2):357-360.(in Chinese)
[3] 王真,江建慧.基于概率转移矩阵的串行电路可靠度计算方法[J]. 电子学报,2009,37(2):241-247. Wang Z,Jiang J H.A serial method of circuit reliability calculation based on probabilistic transfer matrix[J]. Acta Electronica Sinica,2009,37(2):241-247.(in Chinese)
[4] Jie Xiao,Jianhui Jiang,Xuguang Zhu,et al.A method of gate-level circuit reliability estimation based on iterative PTM model[A]. Proceedings of the 2011 IEEE 17th Pacific Rim International Symposium on Dependable Computing[C]. Pasadena,California,USA:IEEE Computer Society,2011.276-277.
[5] 肖杰,江建慧,朱旭光.一种基于迭代PTM模型的电路可靠性评估方法[J]. 计算机学报,2014,37(7):1508-1520. Xiao J,Jiang J H,et al.Amethod of circuit reliability estimation based on iterative PTM model[J]. Chinese Journal of Computers,2014,37(7):1508-1520.(in Chinese)
[6] Franco DT,Vasconcelos MC,et al.Reliability analysis of logic circuits based on signal probability[A]. 15th IEEE International Conference on Electronics,Circuits and Systems[C]. St Julien's,Malta:IEEE Computer Society,2008.670-673.
[7] Franco DT,Vasconcelos MC,Naviner L,et al.Reliability of logic circuits under multiple simultaneous faults[A]. 51st Midwest Symposium on Circuits and Systems[C]. Knoxville,TN:IEEE Computer Society,2008.265-268.
[8] J Torras Flaquer,J M Daveau,et al.Fast reliability analysis of combinatorial logic circuits using conditional probabilities[J]. Microelectronics Reliability,2010,50(9):1215-1218.
[9] 蔡烁,邝继顺,刘铁桥,等.一种高效的门级电路可靠度估算方法[J]. 电子与信息学报,2013,35(5):1262-1266. Cai S,Kuang J S,et al.An efficient reliability estimation method for gate-level circuit[J]. Journal of Electronics & Information Technology,2013,35(5):1262-1266.(in Chinese)
[10] Singh N S S,Hamid N H,Asirvadam V S,et al.Evaluation of circuit reliability based on distribution of different signal input patterns[A]. 8th IEEE International Colloquium on Signal Processing and Its Applications[C]. Melaka,Malaysia:IEEE Computer Society,2012:5-9.
[11] Singh N S S,Hamid N H,Asirvadam V S,et al.Sensitivity analysis of probability transfer matrix(PTM) on same functionality circuit architectures[A]. 8th IEEE International Colloquium on Signal Processing and Its Applications[C]. Melaka,Malaysia:IEEE Computer Society,2012:250-254.
[12] 欧阳城添,江建慧.基于概率转移矩阵的时序电路可靠度估计方法[J]. 电子学报,2013,41(1):171-177. OuYang C T,Jiang J H.Reliability estimation of sequential circuit based on probabilistic transfer matrices[J]. Acta Electronica Sinica,2013,41(1):171-177.(in Chinese)
[13] Seyyed Mahdavi S J,Mohammadi K.SCRAP:Sequential circuits reliability analysis program[J]. Microelectronics Reliability,2009,49(8):924-933.
[14] K Lingasubramanian,S Bhanja.An error model to study the behavior of transient errors in sequential circuits[A]. Proc Of 22nd International Conference on VLSI Design[C]. New Delhi,India:IEEE Computer Society,2009.485-490. |