陷阱效应对4H-SiC MESFET频率特性的影响

吕红亮;张义门;张玉明;车勇;王悦湖;邵科

The Influence of Trapping Effect on Frequency Characteristics in 4H-SiC MESFETs L Hong-liang¹,ZHANG Yi-men¹,ZHANG Yu-ming¹,CHE Yong²,WANG Yue-hu1,SHAO Ke¹

电子学报 . 2008, (5): 933 -936 .

模态框（Modal）标题