基于IC互连线开路故障的Y/R模型

赵天绪;郝跃;马佩军 )

Y/R Model of Integrated Circuits Based on the Open Circuit Fault of Interconnections

ZHAO Tian-xu;HAO Yue;MA Pei-jun

电子学报 . 2002, (11): 1707 -1710 .