Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology

WEN Yi, CHEN Jian-jun, LIANG Bin, CHI Ya-qing, HUANG Jun

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ACTA ELECTRONICA SINICA ›› 2022, Vol. 50 ›› Issue (11) : 2653-2658. DOI: 10.12263/DZXB.20211691

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Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology

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{{article.zuoZheEn_L}}. {{article.title_en}}[J]. {{journal.qiKanMingCheng_EN}}, 2022, 50(11): 2653-2658. https://doi.org/10.12263/DZXB.20211691

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