×
模态框（Modal）标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框（Modal）标题
×
CIE Homepage
|
Join CIE
|
Login CIE
|
中文
Toggle navigation
Home
About
Introduction
Publication Ethics
Contact Us
Subscription
Editorial Board
All Issues
Archive
Virtual Issue
Top Downloaded
Top Read
Most cited
Online First
Author Guide
Author Guide
Download Center
Failure Models and Comparison on Short-Circuit Performances for SiC JFET and SiC MOSFET
ZHOU Yu-ming, LIU Hang-zhi, YANG Ting-ting, CHEN Zhao-quan
Acta Electronica Sinica . 2019, (
3
): 726 -733 . DOI: 10.3969/j.issn.0372-2112.2019.03.030
