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Failure Models and Comparison on Short-Circuit Performances for SiC JFET and SiC MOSFET
ZHOU Yu-ming, LIU Hang-zhi, YANG Ting-ting, CHEN Zhao-quan
Acta Electronica Sinica . 2019, (
3
): 726 -733 . DOI: 10.3969/j.issn.0372-2112.2019.03.030
