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Package Test and Output Characteristics of GaN-Based Hetero Junction Structure Hall Sensors
MA Kai-ming, DAI Jian-xun, ZHANG Hui, DING Nan-nan, SUN Nan, SUN Zhong-hao, LIU Yan-hong, C LIANG Yung, HUANG Huo-lin
Acta Electronica Sinica . . DOI: 10.12263/DZXB.20230262
