It is proposed that the electronic equipment test project is a tree construction due to the testing characteristics.So the optimal selection of the whole test project can be decomposed into a set of optimal selection of subprojects or grand-projects.The grey effect measure optimal selection model (GEMOSM) and grey incidence optimal selection model (GIOSM) and their corresponding algorithms are introduced.The GEMOSM method is to convert a multiple-objective optimal selection question into a data comparison question of the effect function with weighted factors through the grey data effect measure processing of project objective attribute.The decision makers can set their decision preferences by tuning the weighting factors of the model.Based on the principle of relative optimum

the GIOSM method is to determine the optimal test project by comparing the degree of grey incidence of the data sequence acquired from the projects under selection and the reference data sequence.Using two proposed models

the paper studies an optimal selection question of three projects in a electronic equipment test.The result shows that these two models and algorithm are simple

intuitive and feasible.And from the view of technology

it is reasonable to apply the grey system theory to the domain of the electronic equipment test.