纳米级CMOS集成电路的单粒子效应及其加固技术
赵元富, 王亮, 岳素格, 孙永姝, 王丹, 刘琳, 刘家齐, 王汉宁
Single Event Effect and its Hardening Technique in Nano-scale CMOS Integrated Circuits
ZHAO Yuan-fu, WANG Liang, YUE Su-ge, SUN Yong-shu, WANG Dan, LIU Lin, LIU Jia-qi, WANG Han-ning
电子学报
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2018, (10): 2511
-2518
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DOI: 10.3969/j.issn.0372-2112.2018.10.027
