高温CMOS集成电路闩锁效应分析

柯导明;陈军宁;周国祥;代月花;高珊;孟坚;赵海峰

The Analysis of Latch Up Characteristics in High Temperature CMOSIntegrated Circuits

KE Dao-ming;CHEN Jun-ning;ZHUO Guo-xiang;DAI Yue-hua;GAO Shan;MENG Jian;ZAO Hai-feng

电子学报 . 2002, (12): 1894 -1896 .