32nm CMOS工艺三点翻转自恢复锁存器设计
黄正峰, 潘尚杰, 曹剑飞, 宋钛, 欧阳一鸣, 梁华国, 倪天明, 鲁迎春
Design of Triple-Node-Upset Self-Recovery Latch in 32nm CMOS Technology
HUANG Zheng-feng, PAN Shang-jie, CAO Jian-fei, SONG Tai, OUYANG Yi-ming, LIANG Hua-guo, NI Tian-ming, LU Ying-chun
电子学报
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2021, (2): 394
-400
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DOI: 10.12263/DZXB.20200530
