VLSI金属互连线1/<em>f<sup> γ</sup></em>噪声指数与电迁移失效

杜磊;庄奕琪;薛丽君

Correlation between Frequency Exponent of 1/f^γ Noise and Electromigration Failure in VLSI Interconnections

DU Lei;ZHUANG Yi-qi;XUE Li-jun

电子学报 . 2003, (2): 183 -185 .