NMOSFET器件不同源、不同γ剂量率辐射损伤比较
何宝平;王桂珍;周 辉;罗尹虹;姜景和
A Comparison of Ionizing Radiation Damage in NMOSFET Device from Different Radiation Resources and Different Dose Rate 60Co Gamma Rays
HE Bao-ping;WANG Gui-zhen;ZHOU Hui;LUO Yin-hong;JIANG Jing-he
电子学报
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2002, (8): 1229
-1231
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