线性余因子差分亚阈电压峰技术测量电应力诱生MOSFET界面陷阱的研究
何 进;张 兴;黄 如;王阳元
Study on Extraction of Stress-Induced Interface Traps in MOSFETs by Linear Cofactor Differernce Subthreshold Voltage Peak Technique
HE Jin;ZHANG Xing;HUANG Ru;WANG Yang-yuan
电子学报
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2002, (8): 1108
-1110
.
