FLOTOXEEPROM擦写过程中隧道氧化层陷阱俘获电荷的研究
于宗光;徐征;叶守银;张国华;黄卫;王万业;许居衍
The Research of Trapped Charges in FLOTOX EEPROX Tunnel Oxide During Erase/Write Cycles
YU Zong-guang;XU zheng;YE Shou-yin;ZHANG Guo-hua;HUANG Wei;WANG Wan-ye;XU Ju-yan
电子学报
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2000, (5): 68
-70
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