薄栅介质层可靠性与陷阱统计分析

姚峰英;胡恒升;张敏

Relation Between the Reliability of Thin Dielectric Film and Statistical Analysis of Traps

YAO Feng-ying;HU Heng-sheng;ZHANG Min

电子学报 . 2001, (11): 1522 -1525 .