利用场发射显微镜测算碳化钨薄膜的逸出功
孙建平;张兆祥;侯士敏;张耿民;赵兴钰;刘惟敏;薛增泉
Work Function of Tungsten Carbide Thin Film Calculated Using Field Emission Microscopy
SUN Jian-ping;ZHANG Zhao-xiang;HOU Shi-min;ZHANG Geng-min;ZHAO Xing-yu;LIU Wei-min;XUE Zeng-quan
电子学报
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2002, (5): 655
-657
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