电子学报 ›› 2020, Vol. 48 ›› Issue (11): 2258-2262.DOI: 10.3969/j.issn.0372-2112.2020.11.023

所属专题: 微波器件

• 学术论文 • 上一篇    下一篇

基于金刚石NV色心的带状线芯片微波场成像

郭志刚1, 陈国彬1,2, 顾邦兴1, 和文豪1, 姜海峰1, 王昊1, 杜关祥1   

  1. 1. 南京邮电大学通信与信息工程学院, 江苏南京 210003;
    2. 宿迁学院机电工程学院, 江苏宿迁 223800
  • 收稿日期:2019-12-02 修回日期:2020-02-25 出版日期:2020-11-25 发布日期:2020-11-25
  • 通讯作者: 杜关祥
  • 作者简介:郭志刚 男,1996年出生,江苏淮安人,2018年在金陵科技学院获得通信工程学士学位,目前正在南京邮电大学通信与信息工程学院攻读硕士学位,研究方向为量子微波场成像与测量.E-mail:861150340@qq.com;陈国彬 男,1987年出生,内蒙古呼伦贝尔人,2005年至2015年在中国太原中国北方大学获得学士、硕士和博士学位.2015年进入中国宿迁宿迁学院任教.自2018年起,在中国南京邮电大学彼得·格伦伯格研究中心担任博士后研究员.目前的研究兴趣包括从直流到高频的磁场矢量传感和成像.E-mail:cgb8241016@163.com
  • 基金资助:
    国家重点研发计划(No.2017YFB0403602);江苏省特聘教授项目(No.RK002STP15001);南京邮电大学校长特聘教授项目(No.NY214136);宿迁市产业发展引导资金项目(No.K201912);江苏省自然科学基金(No.SBK2020041231)

Microwave Field Imaging of Stripline Chip Based on Nitrogen-Vacancy Center Ensembles in Diamond

GUO Zhi-gang1, CHEN Guo-bin1,2, GU Bang-xing1, HE Wen-hao1, JIANG Hai-feng1, WANG Hao1, DU Guan-xiang1   

  1. 1. College of Telecommunications and Information Engineering, Nanjing University of Posts and Telecommunications, Nanjing, Jiangsu 210003, China;
    2. Electromechanic Engineering College, Suqian College, Suqian, Jiangsu 223800, China
  • Received:2019-12-02 Revised:2020-02-25 Online:2020-11-25 Published:2020-11-25

摘要: 为了满足集成微波器件进行高分辨率微波近场测量的需求,本论文提出了一种基于金刚石氮空位(Nitrogen-Vacancy,NV)色心的微波近场成像技术.该技术可用于查找芯片等集成微波器件的干扰源和信号串扰.此微波近场成像方法采用金刚石NV色心颗粒作为场传感器,其中金刚石颗粒固定在锥形光纤的末端.由于塞曼效应,NV色心的光探测磁共振(Optical Detection Magnetic Resonance,ODMR)谱在外部静磁场环境中会分裂成为8个峰,通过测量共振峰频点的Rabi振荡谱,能够得到Rabi频率,接着通过2.8MHz/Gauss换算得出该处的微波场强度,最后通过将所测得所有数据点进行二维图像处理即可得到所测芯片和集成微波器件的表面微波场近场图像.

关键词: 微波场成像, 金刚石NV色心, 芯片, 高分辨率

Abstract: In order to meet the needs of integrated microwave devices for high-resolution microwave near-field measurement,this paper proposes a microwave near-field imaging technology based on the diamond Nitrogen-Vacancy (NV) color center.This technology can be used to find interference sources and signal crosstalk of integrated microwave devices such as chips.This microwave near-field imaging method uses diamond NV color center particles as a field sensor,where the diamond particles are fixed at the end of a tapered fiber.Due to the Zeeman effect,the optical detection magnetic resonance (ODMR) spectrum of the NV color center will split into 8 peaks in the external static magnetic field environment.By measuring the Rabi oscillation spectrum of the resonance peak frequency point,the Rabi frequency can be obtained,and then use 2.8MHz/Gauss to calculate the microwave field strength.Finally,the near-field image of the surface microwave field of the chip and the integrated microwave device can be obtained by performing two-dimensional image processing on all measured data points.

Key words: microwave field imaging, nitrogen-vacancy center ensembles in diamond, chip, high resolution

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